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MIL-STD-883H, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (26 FEB 2010)., This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes: a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions. b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices. c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.【英文标准名称】:Environmentaltesting-Part2-47:Test-Mountingofspecimensforvibration,impactandsimilardynamictests
【原文标准名称】:环境试验.第2-47部分:试验.振动、冲击及类似动态试验用试件的安装
【标准号】:IEC60068-2-47-2005
【标准状态】:现行
【国别】:国际
【发布日期】:2005-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC104
【标准类型】:()
【标准水平】:()
【中文主题词】:环境;仪器;性能试验;夹持装置;电气元件;电驱动装置;材料试验;规范(验收);试验;电气工程;电气器具;指导手册;振动试验;电学;环境试验;振动;固定件;气候试验;技术产品;元部件;定义;夹紧装置;机械试验;电子设备及元件;加速度;动态试验;冲击试验;紧固方式;冲击;架设(施工作业);恒值冲击;加速
【英文主题词】:Accelerate;Acceleration;Clampingdevices;Climatictests;Components;Definitions;Dynamictesting;Electricappliances;Electricalcomponents;Electricalengineering;Electrically-operateddevices;Electricity;Electronicequipmentandcomponents;Environment;Environmentaltesting;Erecting(constructionoperation);Fixings;Guidebooks;Holdingdevices;Holdings;Impacttests;Instruments;Manneroffastening;Materialstesting;Mechanicaltesting;Packages;Performancetests;Permanentshocking;Products;Shock;Specification(approval);Technicalproducts;Testing;Vibration;Vibrationtests
【摘要】:本部分适用于确定元件、设备或其他产品在高湿度与温度循环变化组合且通常会在试验样品表面产生凝露的条件下使用、运输和贮存的适应性。如果本试验用于检验带包装样品在运输和贮存过程中的性能时,应带包装一起进行试验。对于小的,质量轻的样品使用本试验,在样品表面产生凝露可能比较困难；用户应考虑使用其他替代试验,如GB／T2423．34—2005。
【中国标准分类号】:K04
【国际标准分类号】:19_040
【页数】:29P.;A4
【正文语种】:英语